Apparatus for testing redundant elements in a packaged semiconductor memory device

ABSTRACT

During compression mode testing of a semiconductor memory device, a memory address is compressed to free up 2 or more bits in the address (e.g., an 11-bit address is compressed to 9-bits, freeing up 2 bits). Redundant element enable circuitry is coupled to one or more pins on a packaged chip that are unused during the compression mode testing. The circuitry receives control signals from external testing circuitry to select between the primary memory array in the chip, and redundant rows and columns of memory in the chip. As a result, during compressed address mode testing of the chip, a full 11-bit word is input to test the circuitry, but where 2 of the 11 bits allow the external circuitry to toggle between, and thereby selectively access, the rows and columns of primary and redundant memory in the chip. Alternatively, the circuitry can also be coupled to a non-connected pin on the packaged chip so as to operate during a non-compression mode testing.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a Divisional of U.S. patent application Ser. No.08/924,483, filed Aug. 18, 1997, now U.S. Pat. No. 5,978,289, which is aDivisional of U.S. patent application Ser. No. 08/633,133, filed Apr.16, 1996, now U.S. Pat. No. 5,781,486, issued Jul. 14, 1998.

TECHNICAL FIELD

The present invention relates to apparatus and methods for testingsemiconductor electrical devices, particularly memory devices.

BACKGROUND OF THE INVENTION

Testing is performed on semiconductor devices to locate defects andfailures in such devices, typically occurring during the manufacture ofthe semiconductor devices. As circuit density on semiconductor devicesincreases, the number of defects and failures can increase.Semiconductor manufacturers, therefore, have an increasing need todetect defects and failures in semiconductor devices as circuit densityincreases.

Thus, for quality control and to improve yields of semiconductordevices, semiconductor devices are tested, often before a die containingthe semiconductor device is packaged into a chip. A series of probes ona test station electrically contact pads on each die in a wafer toaccess portions of the individual semiconductor devices on the die. Forexample, in a semiconductor memory device, the probes contact addresspads and data input/output pads to access selected memory cells in diememory device. Typical dynamic random access memory devices ("DRAM")include one or more arrays of memory cells that are each arranged inrows and columns. Each array of memory cells includes word or row linesthat select memory cells along a selected row, and bit or column lines(or pairs of lines) that select individual memory cells along a row toread data from, or write data to, the cells in the selected row.

During testing, predetermined data or voltage values are typicallywritten to selected row and column addresses that correspond to certainmemory cells, and then the voltage values are read from those memorycells to determine if the read data matches the data written to thoseaddresses. If the read data does not match the written data, then thememory cells at the selected addresses likely contain defects and thesemiconductor device fails the test.

Nearly all semiconductor devices, particularly memory devices, includeredundant circuitry on the semiconductor device that can be employed tocompensate for certain detected failures. As a result, by enabling suchredundant circuitry, the device need not be discarded even if it fails aparticular test. For example, memory devices typically employ redundantrows and columns of memory cells so that if a memory cell in a column orrow of the primary memory array is defective, then an entire row orcolumn of redundant memory cells can be substituted therefor,respectively.

Substitution of one of the spare rows or columns is conventionallyaccomplished by opening fuses (or closing antifuses) in a row or columndecoder on the die. Conventional fuses include polysilicon fuses whichcan be opened by a laser beam, and also avalanche-type fuses andantifuses. If a given row or column in the array contains a defectivememory cell, then the wafer can be moved to another station where alaser blows a fuse to enable a redundant row or column. The redundantrow or column is then accessed simply providing the address to a row ofaddress decoder that substitutes the appropriate redundant row/columnfor the defective row or column in the primary memory array.

The rows and columns of redundant memory cells, as well as the primarymemory cells, must be tested. During the testing process, additionalpads are provided on the die so that probes on the test station canwrite data to and read data from these redundant rows and columns.

A semiconductor device can be most thoroughly tested when the device isstill in die form on the semiconductor wafer. The series of testsperformed on the semiconductor device while in die form are typicallyperformed in a sequential manner where initial tests attempt to weed outdies that may fail under future tests. These dies are typicallydiscarded as being fatally defective at an early stage because it istime-intensive, and therefore expensive, to thoroughly test such dies ifinitial test results of the die conclude that the device will likelyfail. Furthermore, it is even more expensive to prepare and package adie into a chip. As a result, it is desirable to determine at an earlystage which dies will fail as acceptable packaged chips.

For example, if the test of the die shows that some of the redundantrows and columns contain defects, then the die may be discarded sincemore thorough testing downstream may indicate failures for which aninsufficient number of redundant elements can be employed. Therefore,the decision is made to mark a given die as defective, and therefore notincur the expense of preparing, packaging and testing the chip whichwill likely fail during downstream testing. A small margin of devices,however, could pass future tests, and therefore be commerciallyacceptable (e.g., only a few defects on the device are discovered andtherefore only a few redundant rows/columns are necessary). Therefore,it would be desirable to package and test nearly every die to therebyproduce a greater number of commercially acceptable chips. However,packaged chips cannot be as thoroughly tested as unpackaged dies inwafer form. Therefore, it would be desirable to be able to fully testpackaged chips in the same manner as unpackaged dies.

Another drawback of testing semiconductors in wafer form is thatsemiconductor wafers are often difficult to manipulate, and typicallyrequire a test bed or other apparatus to releasably secure the waferwhile the probes are moved to contact the pads on each die.Additionally, moving the wafer from one test station to another (e.g.,to a second station having a laser for blowing fuses), adds to dietime-consuming nature of testing semiconductor devices in die form.Overall, the testing of semiconductor devices in die form is timeconsuming. Therefore, semiconductor manufacturers desire to test a givensemiconductor device after it has been packaged as a semiconductor chip,because the chip can be automatically inserted into a test socket usingpick and place machinery. Automated testing circuitry can then applypredetermined voltages and signals to the chip, write test patternsthereto, and analyze the results therefrom to detect for failures in thechip.

Often, the number of pads on a die is greater than the number of pins onthe packaged semiconductor chip. Therefore, as noted above, certaintests performed while the semiconductor device is in die form cannot beperformed on the device after it has been packaged. For example,redundant rows/columns can be directly accessed when the device is indie form, but not when packaged into a chip. As a result, packaged chipsnecessarily undergo less rigorous testing than unpackaged dies. Packagedchips can include manufacturing defects that are not yet failures andthus are undetectable by the limited number of tests capable of beingperformed on the packaged chips.

To provide for rapid testing of chips, and to compensate for thelimitation on the number of pads accessible in a packaged chip,manufacturers currently employ on chip test mode circuitry thatinitiates a special test mode when a predetermined combination ofsignals or "test key vector" signals are applied to the pins of thechip. For example, external test circuitry can force a low value to awrite enable pin WE before signals applied to column address select("CAS") pin and row address select ("RAS") pin fall to a low value. Thetest key vector signals applied to the pins are preferably selected tobe signals not normally applied to such pins by a user under normaloperation of the chip, and therefore, a user would not accidentallyenter the test mode for the chip. To further ensure that a user does notaccidentally enter into a test mode for the chip, a continuoussupervoltage (e.g., 10 volts) must be applied to a pin on the chip toenter the test mode. Such a supervoltage is one beyond the normaltolerances for the chip and therefore would not normally be applied tothe chip by a user under normal conditions.

For example, the redundant rows/columns can be accessed by applying acertain test key vector signal and a supervoltage to the chip, whichallows the chip to enter into a particular test mode. The redundant rowsand columns can then be tested while the die is in its packaged chipform, even though a particular pad on the die is not directlyaccessible.

While it is desirable to test the redundant rows and columns after thedie has been packaged as a chip, the currently known methods foraccessing and testing the redundant rows/columns is time-consuming.External testing circuitry, after accessing and testing the rows andcolumns of cells in the primary memory array, must apply a new test keyvector signal and supervoltage of the chip to access the redundant rowsand columns. The need to apply the test key vector signal andsupervoltage adds additional steps during the testing process whichnecessarily increases the time required to test the chip.

Additionally, current memory devices divide the primary array of memorycells into sub-arrays, or blocks, so that only a portion of the memoryneed be energized in a given access, resulting in significant powerreduction. As the number of sub-arrays or blocks increases, e.g., up to16 or 32 blocks, each block typically includes its own redundant rowsand columns. As a result, conventional testing of the redundant rows andcolumns requires the external testing circuitry to frequently enter intoand out of the special test mode for accessing the various redundantrows/columns. In other words, the external test circuitry mustfrequently and repeatedly apply the test key vector signal andsupervoltage for each redundant row and column in the multiple blocks,which thereby further increases the time-consumptive nature of suchtesting.

SUMMARY OF THE INVENTION

The present invention allows rows and columns of redundant elements inpackaged semiconductor chips, such as DRAMs and other semiconductormemory devices, to rapidly undergo testing when in packaged form, wheresuch testing previously had been available only under time-consumingprocesses. During testing, addresses are typically compressed ormultiplexed so that a single address can access multiple locations in amemory array and thereby allow data to be written and read from multiplelocations using a reduced size address word. As a result, where an11-bit address word is typically required to access a particular memorycell in the array, under compression testing, only a 9- or 10-bit testaddress is used to access multiple memory cells. By employing a reducedbit address word, one or more address pins are unused during thecompression testing.

A redundant element access circuit on the die with the memory device iscoupled to the one or more unused address pins. The access circuitreceives a control signal that allows external testing circuitry toselect between the primary memory array and the redundant rows andcolumns. Therefore, during compressed address mode testing, a full11-bit word is employed by the testing circuitry to test both theprimary memory array and the redundant rows and columns, where two ofthe 11 bits select between the primary memory array and the redundantrows and/or columns, while the remaining bits are the typical compressedtest address. No supervoltage or test key vector signal is required toinitiate a new testing mode to access the redundant rows/columns.Rather, a simple address word, as is typically employed, is modified toaccess and thereby test the redundant rows and columns. As a result, thepresent invention allows both primary and redundant elements such asmemory cells to be rapidly tested in a packaged chip. Since packagedchips can be tested in parallel, using automated equipment, as opposedto testing in die form, the present invention provides a tremendous timesaving step during the testing of semiconductor devices.

In a broad sense, the present invention embodies a semiconductor devicehaving a die and a plurality of terminals. The terminals include accessterminals for receiving access signals. The semiconductor deviceincludes a semiconductor circuit, control and access circuitry, and aredundant element access circuit.

The semiconductor circuit is formed on the die and has a plurality ofprimary circuit elements and a plurality of redundant circuit elements.The plurality of primary and at least some of the redundant circuitelements are addressable by electrically conductive lines based on anaccess word applied to the access terminals.

The control and access circuitry is coupled to the terminals and to theelectrically conductive lines for permitting communication with theplurality of primary and redundant circuit elements. The redundantelement access circuit is coupled to the control and access circuitryand to at least one of the access terminals. The redundant elementaccess circuit receives an externally applied element select signal thatis applied to the at least one of the access terminals. The redundantelement access circuit outputs a redundant element select signal toallow the control and access circuitry to access at least one of theplurality of redundant elements in response thereto.

The present invention also embodies a computer system having an inputdevice, an output device, an address bus, a data bus, a set of controllines, a memory controller, a processor, and a memory device. The memorycontroller is coupled to the address and data buses and to the set ofcontrol lines. Similarly, the processor is coupled to the input andoutput devices, and to the address and data buses and to the set ofcontrol lines. The memory device is coupled to the memory controllerthrough the address and data buses and the set of control lines.

The memory device includes a memory circuit formed on a die havingterminals including address terminals coupled to the address bus. Thememory circuit has a plurality of primary memory cells and a pluralityof redundant memory cells. The plurality of primary and at least some ofthe redundant memory cells are addressable by electrically conductivelines based on an address word applied to the address terminals. Theaddress word has a predetermined bit length. Control and addresscircuitry is coupled to the terminals and to the electrically conductivelines for permitting communication with the plurality of primary andredundant memory cells. A redundant element access circuit is coupled tothe control line address circuitry and to at least one of the addressterminals, so as to receive an externally applied element select signalapplied to the at least one of the address terminals. The redundantelement access circuit outputs a redundant element access signal toallow the control address circuitry to access at least some of theplurality of redundant elements.

The present invention solves problems inherent in the prior art ofsemiconductor testing and provides additional benefits by allowing rapidtesting to be performed on redundant elements in packaged semiconductorchips. As a result, the present invention avoids many of the drawbacksof testing unpackaged devices in die form. Other features and advantagesof the present invention will become apparent from studying thefollowing detailed description of the presently preferred embodiment,together with the following drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram of a semiconductor memory device under thepresent invention.

FIG. 2 is a partial isometric, partial block diagram of a testingstation for testing a packaged semiconductor chip embodying the memorydevice of FIG. 1.

FIG. 3 is a schematic diagram of a redundant element enable circuitemployed by the memory device of FIG. 1.

FIG. 4 is a block diagram of a computer system that incorporates thememory device of FIG. 1.

FIG. 5 is a block diagram of a packaged chip embodying an alternativeembodiment of the present invention.

DETAILED DESCRIPTION OF THE INVENTION

Referring to FIG. 1, a semiconductor device such as a memory device 100includes one or more memory arrays 102 each having primary memorysub-arrays such as four sub-arrays 103, 104, 105 and 106. Each of theprimary memory sub-arrays 103-106 have redundant rows 107 and redundantcolumns 108 of memory cells. As described above, the redundant rows andcolumns 107 and 108 are selectively enabled to replace defective rows orcolumns of memory cells, respectively, in the primary memory sub-arrays103-106.

A control logic and address buffer 110 receives externally appliedsignals such as an 11-bit addresses word on address lines or pinsA0-A10. The control logic and address buffer 110 also receivesexternally generated control signals such as column address strobe CAS,row address strobe RAS, write enable WE, and so forth, as is known bythose skilled in the relevant art. When the control logic and addressbuffer 110 receives the addresses on address lines A0-A10, it buffersand latches the addresses, and outputs them to a row decoder 111 andcolumn decoder 112. The row decoder 111 decodes the address and appliesit to the memory array 102 to enable a selected row in the array, whilethe column decoder 112, through a sense amplifier and input/outputgating circuit 114, enables one or more columns in the array. The senseamplifier and input/output gating circuit 114 senses a value on the oneor more columns and outputs the data to a data input/output buffer 116,which in turn provides the data to data lines. The memory device 100also includes a redundant element selector address circuit 120 and testmode circuitry 122 as part of the control logic and address buffer 110,as described more fully below.

The device 100 can be a 1 megabit by 4 semiconductor memory devicehaving four memory cell arrays 102 (only one of which is shown in FIG.1). Each memory cell array 102 is preferably subdivided into sub-arrays,for example, as shown by the four blocks 103-106. By dividing the memoryinto four arrays 102, data is multiplexed into the device 100 so thateach memory array is addressed by its own data line, and therefore thedevice has four data lines DQ1-DQ4.

As is known in the art, during writing of data, 4-bits of test data isdriven onto the data lines DQ1-DQ4 for storage in each of thecorresponding memory arrays 102 based upon a logical address applied tothe address pins A0-A10. The device 100 stores the 4-bits of the testdata in at least one particular address memory location in fourrespective memory arrays 102. Since the device 100 is a 1 megabit by 4memory device, 1,024 row lines and 1,024 column lines, are used toaccess over 1,000,000 memory cells in each of the four memory arrays102. The control logic and address buffer 110, in response to the CAS,RAS, WE, and other control signals, operates the row decoder 111, columndecoder 112, sense amps and I/O gating circuit 114, and data I/O buffers116 to write data to, or read data from, the array 102. Additionaldescription regarding writing data to, or reading data from, the memorydevice 100 is unnecessary, as such details are known to those skilled inthe art.

The memory array 102 (with redundant rows and columns 107 and 108) andthe components 110-116 are monolithically formed on a substrate or die,which is encapsulated by a protective material, such as epoxy orplastic, to form a packaged chip 101 as shown in FIG. 2. Pins or leads128 extending from the packaged chip 101 provide the terminals for thedevice 100 so that the addresses A0-A10, control signals CAS, RAS, WE,etc., can be applied to the control logic and address buffer 110, anddata can be input to and output from the data input/output buffer 116over the data lines DQ1-DQ4, as is known in the art. Additional pinsprovide power to the device 100.

A testing station 170 for testing the packaged chip 100 has a socket 172for releasably holding the chip and providing electrical interconnectionbetween the pins 128 and external test circuitry 174. An external powersupply 176 coupled to the socket 172 and the test circuitry 174 providesexternal power to the chip 100. Conventional automated pick and placemachinery 178 can manipulate the chip and insert it into the test socket172 for testing it to even more rapidly test the device 100 than when itis in die form. The test circuitry 174 of the test station 170preferably includes microprocessor or microcontroller circuitry andmemory for performing test routines.

To access the rows and columns of memory cells in all of the four memoryarrays 102, all eleven address pins 128, A0 through A10, on the packagedchip 101 are required. As noted above, however, during a compressiontest mode for the chip 101, address values are compressed or multiplexedto allow similar data to be written to multiple address locations in thememory arrays 102. By compressing address values and accessing, e.g.,two sub-arrays 103 and 104 simultaneously, fewer addresses are required.As a result, only ten of the eleven address pins are required to accessall of the rows 300. With such an arrangement, one of the eleven addresspins is available for use for inputting an additional signal. If thefour sub-arrays 103-106 are accessed simultaneously, only 9 of 11address pins 128 are required to access all the memory cells, therebyfreeing up 2 of the 11 address pins.

During testing of the chip 101, the external testing circuitry 174causes the test mode circuitry 122 of the memory device 100 to enterinto a test mode, and thereby allow the memory array 102 to be tested.For example, the external testing circuitry 174 applies a predeterminedcombination of signals to the WE, CAS, and RAS pins 128 (i.e., a testkey vector signal), which are received by the test mode circuitry 122.In response thereto, the test mode circuitry 122 enters the memorydevice 100 into a compression test mode where preferably both row andcolumn addresses are compressed. Under the compression test mode, asingle data value is written to one memory cell in each of the foursub-arrays 103-106. Under normal operation, for example, the mostsignificant bit in the 11-bit address typically selects betweensub-arrays 103 and 104, while the second-most significant bit selectsbetween sub-arrays 105 and 106. In compression test mode, however, themost and second-most significant bits are unused so that the remaining 9bits in the address write a data value to all four sub-arrays 103-106.Address pins A10 (for the most significant bit) and A9 (for thesecond-most significant bit) are unused. As explained more fully below,the address pins A10 and A9 are then used as input terminals for theredundant element addressing circuit 120 to select between primary andredundant memory elements in the array 102.

During testing of the chip 101, the external circuitry 174 typicallyapplies a known value to multiple memory cells in the array 102, such asin a checkerboard pattern. A compare circuit (not shown) in the externaltest circuitry 174 compares the written to value to the read from valueto determine whether any errors, and thus failures, have occurred.Additional tests such as tinning, precharge, etc., are likewiseperformed on the chip 101. If additional tests are required, theexternal testing circuitry ceases to apply the supervoltage to the chip100. In response thereto, the test mode circuitry 122 exits its currenttest mode, and returns the chip 100 to its normal operating mode.Thereafter, the external test circuitry can reapply the supervoltage,and apply another test key vector signal, to cause the test modecircuitry 122 to enter into a different test mode for the device 100.

Under the present invention, however, the external test circuitry 174only initially applies a signal or a combination of signals to thedevice 100 to cause the test mode circuitry 122 to enter into thecompression test mode (e.g., by applying a continuous supervoltage toone of the pins 128, and then applying a test key vector). The externaltest circuitry 174 thereafter applies a series of compressed addresssignals to the address pins A0-A8 to access selected memory cells in thearray 102, and applies test data to the data pins DQ1-DQ4, which thedevice 100 writes to the appropriate locations. In addition, theexternal test circuitry 174 applies a test key signal to the A9 addresspin 128 to select between the columns of primary or redundant memorycells, and applies a similar test key to the address pin A10 to selectbetween rows of primary or redundant memory cells. In other words, theexternal test circuitry 174 applies a 0 or a 1 to the second-mostsignificant bit address pin 128 (A9) of the chip 101 to cause theredundant element address circuit 120 to select between columns in theprimary memory (sub-arrays 103-106) or redundant memory (108),respectively. Therefore, the external test circuitry 107 can apply astandard 11-bit address value to the address pin A0-A10 and simplyselect between primary and redundant memory by toggling between the mostsignificant bit and second-most significant bit, without the need tostop a current testing mode, apply a supervoltage value and a new testkey vector signal for a new test mode to test the redundant memoryelements.

Referring to FIG. 3, exemplary redundant element address circuit 120 isshown as having an input buffer 202 that is coupled to the externaladdress pin XA10 (where the "X" refers to an external pin 128). A twoinput OR gate 204, consisting of a NOR gate whose output is coupled toan inverter, receives at its first input a row compression signalROWCOMP*, which is an enable signal generated by the test mode circuitry122. (The "*" symbol, as used herein, generally refers to a signal whoseactive value is a logical low state.) When the test mode circuitry 122receives the appropriate initializing test key vector signal at thebeginning of a compressed test mode operation, the test mode circuitrycontinuously generates and applies the ROWCOMP* signal to the OR gate204. A buffer power-up signal ABPU*B is applied to the second input ofthe OR gate 204 to power up the buffer 202. As explained below, the ORgate 204 acts as a pass gate so that it outputs a signal only when bothinput signals are at their active (i.e., low) value. For reasons ofpower conservation for the device 100, the ABPU*B signal is applied onlywhen the RAS and CAS signals transition to their active states (e.g.,fall to a low value) so that the buffer is not powered up unnecessarilywhen it is not needed.

A first two input NAND gate 206 in a latch 208 receives the output fromthe buffer 202. An address latch signal ALAT, generated by the controllogic and address buffer 110, is inverted by an inverter 210 and inputto the other input to the NAND gate 206. The inverted ALAT signal isalso applied to a first input of a second two input NAND gate 212, whilethe output of the first NAND gate 206 is input to its second input. TheNAND gates 206 and 212 act to trap the address signal from the inputbuffer 202 within the latch 208. A pair of cross-coupled NAND gates 214and 216 (operating as a set-reset flip-flop) receive the output signalsfrom the NAND gates 206 and 212. The output of the NAND gate 216 is thenbuffered by a buffer 218 (consisting of two serially connectedinverters) and then output as a redundant row pretest signal REDROWPRE*.The output buffer 218 is used as a gain stage to increase the drivecapability of the latch 208.

In operation, the address buffer power-up signal ABPU*B signal has a lowvalue when RAS transitions to its active state (e.g., its low value),while the row compression signal ROWCOMP* has a constant low value whenthe test mode circuitry 122 enters the device 100 into its compressiontest mode. As a result, the OR gate 204 only outputs a low value whenboth the device 100 is in its row compression mode and when RAStransitions to its active state, which in turn causes the buffer 202 topower up and be enabled. Once the buffer 202 is enabled, a test keyapplied by the test circuitry 174 to the external address pin A10 isinput to the latch 208, through the buffer 202. At this time ALAT islow, thereby enabling the NAND gates 206, 212. As a result, when XA10goes high, the output of the NAND gate 206 goes low, thereby causing theoutput of the NAND gate 212 to go high. The low output of the NAND gate206 causes the output of the NAND gate 214 to go high thereby causingthe output of the NAND gate 216 to go low since the NAND gate 216 alsoreceives a high from the NAND gate 212. A redundant row pretest signalthe output REDROWPRE* is then output as a low value. Thus, REDROWPRE*goes low whenever XA10 goes high after the buffer 202 has been enabledand ALAT is low

When an address is latched in the memory device 100 (e.g., when RAStransitions), the control logic and address buffer circuitry 110provides a high value for the ALAT signal to the latch 208, which trapsthe test key signal from the external address pin A10 in the latch. Thevalue of XA10 is trapped in the latch 208 because if ALAT goes high, itis inverted and input as a low value to disable both of the NAND gates206 and 212. As a result, the outputs of the NAND gates 206 and 212cannot go low, despite changes in XA10. By trapping the A10 signal inthe latch 208, by means of a high ALAT signal, the A10 signal maythereafter fluctuate without changing the value previously trapped inthe latch. While the output of the NAND gate 206 goes high when ALATgoes high, the other input to the NAND gate 214 of the flip-flop is low,therefore, the NAND gate 214 still outputs a high value. Consequently,the output REDROWPRE* of the flip-flop (NAND gates 214 and 216) does notchange when ALAT goes high because the two inputs to the NAND gate 216remain high.

Once the latch 208 is set by the address A10 and trapped therein by theaddress latch signal ALAT, the latch outputs a logical low value,buffered by the buffer 208, as the redundant row pretest signalREDROWPRE*, assuming the A10 test key signal input has a high value. Theredundant row pretest signal REDROWPRE* is then applied to the rowdecoder 111, together with an externally applied address from the testcircuitry 174, to access one or more memory cells in the redundant rows107. When ALAT returns to a low value, a high value is again input tothe NAND gates 206 and 212, enabling these NAND gates. As a result, thelatch 208 can reset when ALAT returns to a low value, allowing theaddress A10 to change the state of the latch 208.

Importantly, the test mode circuitry 122 need not enter into a new mode,and a new supervoltage need not be applied to the device 100. Theexternal test circuitry 174 can rapidly and sequentially access bothprimary and redundant memory cells in the memory array 102 by simplyapplying the appropriate addresses to the address pins A0-A10, with theaddress applied to the pin A10 being essentially a test key signal thattoggles between primary and redundant memory.

The circuit 120 of FIG. 3 is generally described above as selectingbetween rows of primary and redundant memory cells in the memory array102. The device 100, however, includes a substantially identical circuitfor accessing the redundant columns 108. Therefore, as shown in FIG. 3,to access the redundant columns, the external testing circuitry appliesa signal to the external address pin XA9, which is input to the buffer202, as shown in parentheses in FIG. 3. Likewise, the test modecircuitry 122 continuously applies a column compression signal COLCOMP*to the OR gate 204, and the ABPU*B signal during the active state forCAS. The redundant element address circuitry 120, for accessing columns,then outputs a redundant column pretest signal REDCOLPRE* as shown inFIG. 3, which is applied to the column decoder 112.

Without the need to wait to change test modes for testing primary andredundant memory, the present invention can test parameters of thedevice 100 which were previously unavailable to packaged chips 101. Forexample, by being able to rapidly and sequentially test primary andredundant memory cells, the test circuitry 174 can test the speed,refresh rate, timing and other aspects of the device 100 and therebyprovide closer correlation of test results for primary and redundantmemory in the device.

The present invention also allows for more thorough testing, includingburn-in testing of the memory circuit 100. "Burn-in" testing refers tothe process of accelerating failures in the memory circuit that occurduring the infant mortality phase of the circuit's life to therebyremove inherently weaker circuits. "Infant mortality" refers to thosememory circuits 100 that would fail early in their lives due tomanufacturing defects. The burn-in process is performed on packagedchips, prior to their shipping to customers. The burn-in process istypically performed at a specified temperature and with specifiedvoltage values for a specified period of time. The burn-in process is anautomated process performed on the packaged chips, and therefore, thepresent invention is ideally suited for allowing the above-describedtesting to be performed on such chips during the burn-in process. As aresult, the burn-in process can provide more effective testing ofpackaged chips before being deemed acceptable devices.

Since the device 100 can be efficiently and thoroughly tested while inits chip form, devices employing the chip 101 can benefit from thepresent invention. Referring to FIG. 4, a block diagram of a computersystem 50 that uses one or more chips 101 embodying the memory device100 is shown. The computer system 50 includes a processor 52 forperforming computer functions, such as executing software to performdesired calculations and tasks. The processor 52 is connected to the oneor more memory devices 100 through a memory controller 62 that providesthe appropriate signals to the memory. One or more input devices 54,such as a keypad or a mouse, are coupled to the processor 50 and allowan operator (not shown) to input data thereto. One or more outputdevices 56 are coupled to the processor 52 to provide the operator withdata generated by the processor 52. Examples of output devices 56include a printer and a video display unit. One or more data storagedevices 58 are coupled to the processor 52 to store data on or retrievedata from external storage media (not shown). Examples of storagedevices 58 and corresponding storage media include drives for hard andfloppy disks, tape cassettes, and compact disc read-only memories(CD-ROMs). Typically, the processor 50 generates the address signalsA0-A10, control signals such as CAS, RAS, WE, etc., and the data DQ1-DQ4that is written to the memory device 100, as shown by the address, data,control, and status buses, shown in FIG. 4.

Referring to FIG. 5, in an alternative embodiment of the presentinvention, the redundant element addressing circuit 120 can be coupledto a non-connected (NC) or unused lead 128 on the packaged chip 101,instead of the external address pin A9 or A10. As a result, in thealternative embodiment of FIG. 5, the redundant element addressingcircuit 120 can be operated even when the device 100 is not in acompression test mode. In such an alternative embodiment, the ROWCOMP*(or COLCOMP*) signals indicate redundant element test mode, rather thancompression test mode.

The redundant element addressing circuit 120 is generally describedabove as employing inverters and NOR gates because the device 100 ispreferably manufactured using conventional NMOS semiconductormanufacturing techniques. Other logic elements or manufacturingtechniques can be substituted to perform the goals of the presentinvention, as is known by those skilled in the relevant art.

While the detailed description has been expressed, in part, in terms ofspecific examples, those skilled in the art will appreciate that manyother variations could be used to accomplish the purpose of thedisclosed invention. For example, those skilled in the art willrecognize that while the device 100 is generally described above asbeing a DRAM memory device, the present invention is applicable toon-chip test circuitry in all memory devices, including high-speedmemory devices such as synchronous DRAM or video or graphics memory(SVRAM and SGRAM), and extended data out, burst extended data out memorydevices (EDO and BEDO).

Those skilled in the art will recognize that the present invention isalso applicable to testing various types of semiconductor circuitry,either in die or packaged form. Additionally, the present invention isapplicable to unpackaged dies in wafer form, known good dies, andmulti-chip modules. Moreover, the present invention need not be limitedto use during testing, but can be employed by the semiconductorcircuitry to access portions of its redundant circuit elements, whennecessary. Accordingly, it can be appreciated that equivalentmodifications to the above-described embodiments can be made withoutdeparting from the spirit and scope of the invention. Therefore, thepresent invention is limited only by the following claims.

What is claimed is:
 1. A method of testing a semiconductor memory devicehaving primary and redundant memory elements and nodes electricallycoupled thereto, including address nodes, the methodcomprising:initiating a compressed address test mode for thesemiconductor memory device; externally applying a predetermined signalto at least one of the address nodes of the semiconductor memory devicewhen the semiconductor memory device is in the compressed address testmode; producing a redundant element select signal in response to theexternally applied predetermined signal; and outputting data from atleast one of the redundant memory elements in response to the selectsignal.
 2. The method of claim 1 wherein outputting data includesreceiving an access signal on at least some of the nodes, and accessingat least one of the redundant memory elements.
 3. The method of claim 1,further comprising encapsulating the semiconductor memory device in anencapsulating material to form an automatically manipulatable packagedchip, and wherein the nodes are externally accessible from the packagedchip.